DocumentCode
2198969
Title
Top 5 Issues in Practical Testing of High-Speed Interface Devices
Author
Yamaguchi, Takahiro J.
Author_Institution
Advantest Lab. Ltd., Sendai
fYear
2007
fDate
8-11 Oct. 2007
Firstpage
519
Lastpage
519
Abstract
Recently very different ways have been proposed to perform jitter testing of high-speed physical layer ICs in an HV production testing environment.
Keywords
integrated circuit noise; integrated circuit testing; jitter; production testing; high-speed interface devices; integrated circuit testing; jitter testing; production testing; resource partitioning; Circuit testing; Clocks; Frequency domain analysis; Frequency measurement; Laboratories; Production; Semiconductor device measurement; Test equipment; Time measurement; Timing jitter;
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location
Beijing
ISSN
1081-7735
Print_ISBN
978-0-7695-2890-8
Type
conf
DOI
10.1109/ATS.2007.122
Filename
4388069
Link To Document