DocumentCode
2203673
Title
Parameter Estimations of the TFR Model under Gompertz Distribution at a Normal Stress
Author
Wang, Yu ; Zhang, Xiaoqin
Author_Institution
Dept. of Math. & Inf. Sci., Qinghai Normal Univ., Xining, China
fYear
2010
fDate
24-26 Aug. 2010
Firstpage
1
Lastpage
4
Abstract
The TFR (Tampered Failure Rate) model was Proposed by Bhattacharyya and Soejoeti (1989) for step-stress accelerated life tests. This paper point out that the strategy provided in for seeking parameter estimates under normal stresses in step-stress Completely accelerated tests using the usual regression analysis is unreasonable, and offers a method of estimating Parameters under a normal stress. For the sake of convenient expression, the paper considers simple SSALT only, but multiple SSALT can be studied similarly.
Keywords
failure analysis; life testing; parameter estimation; product development; stress analysis; Gompertz distribution; TFR model; normal stress; parameter estimation; step-stress accelerated life test; tampered failure rate model; Analytical models; Equations; Exponential distribution; Life estimation; Life testing; Mathematical model; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Management and Service Science (MASS), 2010 International Conference on
Conference_Location
Wuhan
Print_ISBN
978-1-4244-5325-2
Electronic_ISBN
978-1-4244-5326-9
Type
conf
DOI
10.1109/ICMSS.2010.5578437
Filename
5578437
Link To Document