• DocumentCode
    2203673
  • Title

    Parameter Estimations of the TFR Model under Gompertz Distribution at a Normal Stress

  • Author

    Wang, Yu ; Zhang, Xiaoqin

  • Author_Institution
    Dept. of Math. & Inf. Sci., Qinghai Normal Univ., Xining, China
  • fYear
    2010
  • fDate
    24-26 Aug. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The TFR (Tampered Failure Rate) model was Proposed by Bhattacharyya and Soejoeti (1989) for step-stress accelerated life tests. This paper point out that the strategy provided in for seeking parameter estimates under normal stresses in step-stress Completely accelerated tests using the usual regression analysis is unreasonable, and offers a method of estimating Parameters under a normal stress. For the sake of convenient expression, the paper considers simple SSALT only, but multiple SSALT can be studied similarly.
  • Keywords
    failure analysis; life testing; parameter estimation; product development; stress analysis; Gompertz distribution; TFR model; normal stress; parameter estimation; step-stress accelerated life test; tampered failure rate model; Analytical models; Equations; Exponential distribution; Life estimation; Life testing; Mathematical model; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Management and Service Science (MASS), 2010 International Conference on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-5325-2
  • Electronic_ISBN
    978-1-4244-5326-9
  • Type

    conf

  • DOI
    10.1109/ICMSS.2010.5578437
  • Filename
    5578437