• DocumentCode
    2204507
  • Title

    Robust Defect Detection Using Improved Higher Order Wavelet Descriptors and Support Vector Machines for Visual Inspection Systems.

  • Author

    Karras, Dimitrios A.

  • fYear
    2006
  • fDate
    38836
  • Firstpage
    180
  • Lastpage
    185
  • Keywords
    Discrete wavelet transforms; Inspection; Pattern recognition; Robustness; Support vector machine classification; Support vector machines; Vector quantization; Wavelet analysis; Wavelet coefficients; Wavelet domain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Imagining Systems and Techniques, 2006. IST 2006. Proceedings of the 2006 IEEE International Workshop on [Imagining read Imaging]
  • Print_ISBN
    1-4244-0251-4
  • Type

    conf

  • DOI
    10.1109/IST.2006.1650799
  • Filename
    1650799
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2204507