• DocumentCode
    2204865
  • Title

    Novel statistical technique of defective information extraction in pulsed eddy current NDE

  • Author

    Yang, Guang ; Zhang, Qi ; Yang, Yuning ; Tian, Gui Yun

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
  • fYear
    2011
  • fDate
    6-8 June 2011
  • Firstpage
    813
  • Lastpage
    816
  • Abstract
    The pulsed eddy current (PEC) technique as complementary approach of traditional eddy current method has found increasing applications in deep flaw detection and complex structure inspection. Considering the present PEC NDE (non-destructive evaluation) needs valid algorithms and techniques to implement signal processing in time domain, the novel statistical technique based on principle component analysis (PCA) and independent component analysis (ICA) is proposed to extract defective information from transient PEC signals and evaluate flaw inspection during the PEC detection. The presented results of defect classification associated with different flaw types validated the feasibility of proposed technique in this paper.
  • Keywords
    flaw detection; principal component analysis; signal processing; complex structure inspection; deep flaw detection; defective information extraction; flaw inspection; independent component analysis; principle component analysis; pulsed eddy current NDE; time domain signal processing; Data mining; Eddy currents; Feature extraction; Inspection; Integrated circuit modeling; Principal component analysis; Testing; Pulsed eddy current; defect classification; defective information; statistical technique;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information and Automation (ICIA), 2011 IEEE International Conference on
  • Conference_Location
    Shenzhen
  • Print_ISBN
    978-1-4577-0268-6
  • Electronic_ISBN
    978-1-4577-0269-3
  • Type

    conf

  • DOI
    10.1109/ICINFA.2011.5949106
  • Filename
    5949106