DocumentCode
2204865
Title
Novel statistical technique of defective information extraction in pulsed eddy current NDE
Author
Yang, Guang ; Zhang, Qi ; Yang, Yuning ; Tian, Gui Yun
Author_Institution
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
fYear
2011
fDate
6-8 June 2011
Firstpage
813
Lastpage
816
Abstract
The pulsed eddy current (PEC) technique as complementary approach of traditional eddy current method has found increasing applications in deep flaw detection and complex structure inspection. Considering the present PEC NDE (non-destructive evaluation) needs valid algorithms and techniques to implement signal processing in time domain, the novel statistical technique based on principle component analysis (PCA) and independent component analysis (ICA) is proposed to extract defective information from transient PEC signals and evaluate flaw inspection during the PEC detection. The presented results of defect classification associated with different flaw types validated the feasibility of proposed technique in this paper.
Keywords
flaw detection; principal component analysis; signal processing; complex structure inspection; deep flaw detection; defective information extraction; flaw inspection; independent component analysis; principle component analysis; pulsed eddy current NDE; time domain signal processing; Data mining; Eddy currents; Feature extraction; Inspection; Integrated circuit modeling; Principal component analysis; Testing; Pulsed eddy current; defect classification; defective information; statistical technique;
fLanguage
English
Publisher
ieee
Conference_Titel
Information and Automation (ICIA), 2011 IEEE International Conference on
Conference_Location
Shenzhen
Print_ISBN
978-1-4577-0268-6
Electronic_ISBN
978-1-4577-0269-3
Type
conf
DOI
10.1109/ICINFA.2011.5949106
Filename
5949106
Link To Document