• DocumentCode
    2205325
  • Title

    p-Si Microprobe Arrays Grown at Low Temperature by Selective VLS Using In-Situ Doping and Their Properties

  • Author

    Islam, Md Shariful ; Kawashima, T. ; Sawada, Kazuaki ; Ishida, Makoto

  • Author_Institution
    Toyohashi Univ. of Technol., Toyohashi
  • fYear
    2007
  • fDate
    28-31 Oct. 2007
  • Firstpage
    496
  • Lastpage
    499
  • Abstract
    This paper reports the high-yield growth of p-Si microprobe arrays at low temperature by using Au-catalyzed selective vapor-liquid-solid (VLS) growth using in-situ doping VLS growth using Si2H6 only gives intrinsic Si microprobes, which could be doped by diffusion process (at 1100degC) after VLS growth. But in this work we have demonstrated that by incorporating in-situ doping using the gas source of Si2H6 and B2H6 with VLS growth process, doped p-Si microprobes can be realized directly at a temperature (700degC or less) lower than that required at diffusion process. The effects of boron doping on the physical and electrical properties of these p-Si microprobes have been investigated in detail.
  • Keywords
    boron; crystal growth; doping; microelectrodes; silicon compounds; Si2H6:B; diffusion process; in-situ doping; p-Si microprobe array; vapor-liquid-solid growth; Circuit testing; Diffusion processes; Doping; Electrodes; Gold; Intelligent systems; Neurons; Probes; Silicon alloys; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2007 IEEE
  • Conference_Location
    Atlanta, GA
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-1261-7
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2007.4388444
  • Filename
    4388444