DocumentCode
2205325
Title
p-Si Microprobe Arrays Grown at Low Temperature by Selective VLS Using In-Situ Doping and Their Properties
Author
Islam, Md Shariful ; Kawashima, T. ; Sawada, Kazuaki ; Ishida, Makoto
Author_Institution
Toyohashi Univ. of Technol., Toyohashi
fYear
2007
fDate
28-31 Oct. 2007
Firstpage
496
Lastpage
499
Abstract
This paper reports the high-yield growth of p-Si microprobe arrays at low temperature by using Au-catalyzed selective vapor-liquid-solid (VLS) growth using in-situ doping VLS growth using Si2H6 only gives intrinsic Si microprobes, which could be doped by diffusion process (at 1100degC) after VLS growth. But in this work we have demonstrated that by incorporating in-situ doping using the gas source of Si2H6 and B2H6 with VLS growth process, doped p-Si microprobes can be realized directly at a temperature (700degC or less) lower than that required at diffusion process. The effects of boron doping on the physical and electrical properties of these p-Si microprobes have been investigated in detail.
Keywords
boron; crystal growth; doping; microelectrodes; silicon compounds; Si2H6:B; diffusion process; in-situ doping; p-Si microprobe array; vapor-liquid-solid growth; Circuit testing; Diffusion processes; Doping; Electrodes; Gold; Intelligent systems; Neurons; Probes; Silicon alloys; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Sensors, 2007 IEEE
Conference_Location
Atlanta, GA
ISSN
1930-0395
Print_ISBN
978-1-4244-1261-7
Electronic_ISBN
1930-0395
Type
conf
DOI
10.1109/ICSENS.2007.4388444
Filename
4388444
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