• DocumentCode
    2205516
  • Title

    Power and Area Efficient Column-Parallel ADC Architectures for CMOS Image Sensors

  • Author

    Snoeij, Martijn F. ; Theuwissen, Albert J P ; Huijsing, Johan H. ; Makinwa, Kofi A A

  • fYear
    2007
  • fDate
    28-31 Oct. 2007
  • Firstpage
    523
  • Lastpage
    526
  • Abstract
    The ever-increasing resolution of CMOS imagers has had a profound impact on their analog readout electronics, and, in particular, on their ADC architecture. This paper gives an overview of the development of column-parallel ADCs that enable the high-speed and power-efficient readout of high-resolution CMOS imagers. In particular, the recently proposed multiple-ramp single-slope (MRSS) ADC will be discussed.
  • Keywords
    CMOS image sensors; analogue-digital conversion; ADC architecture; CMOS image sensors; column-parallel ADC architectures; multiple-ramp single-slope ADC; power-efficient readout; CMOS image sensors; CMOS technology; Clocks; Counting circuits; Image resolution; Instruments; Laboratories; Pixel; Random access memory; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2007 IEEE
  • Conference_Location
    Atlanta, GA
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-1261-7
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2007.4388451
  • Filename
    4388451