DocumentCode
2205516
Title
Power and Area Efficient Column-Parallel ADC Architectures for CMOS Image Sensors
Author
Snoeij, Martijn F. ; Theuwissen, Albert J P ; Huijsing, Johan H. ; Makinwa, Kofi A A
fYear
2007
fDate
28-31 Oct. 2007
Firstpage
523
Lastpage
526
Abstract
The ever-increasing resolution of CMOS imagers has had a profound impact on their analog readout electronics, and, in particular, on their ADC architecture. This paper gives an overview of the development of column-parallel ADCs that enable the high-speed and power-efficient readout of high-resolution CMOS imagers. In particular, the recently proposed multiple-ramp single-slope (MRSS) ADC will be discussed.
Keywords
CMOS image sensors; analogue-digital conversion; ADC architecture; CMOS image sensors; column-parallel ADC architectures; multiple-ramp single-slope ADC; power-efficient readout; CMOS image sensors; CMOS technology; Clocks; Counting circuits; Image resolution; Instruments; Laboratories; Pixel; Random access memory; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Sensors, 2007 IEEE
Conference_Location
Atlanta, GA
ISSN
1930-0395
Print_ISBN
978-1-4244-1261-7
Electronic_ISBN
1930-0395
Type
conf
DOI
10.1109/ICSENS.2007.4388451
Filename
4388451
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