Universal TSC module and its application to the design of TSC circuits

Author

Pagey, S. ; Al-Khalili, A.J.

Author_Institution

Concordia Univ., Montreal, Que., Canada

Volume

2

fYear

1995

fDate

13-16 Aug 1995

Firstpage

781

Abstract

In this paper, we present a universal totally self-checking (TSC) module and show that it can be used as a TSC AND, OR, NAND or NOR gate by performing appropriate routing at its input and/or output. We use the two-rail code to encode the signals and consider the multiple unidirectional stuck-at-fault model. We study the utility of such TSC modules in obtaining the TSC realization of a given circuit from its gate level description. We show that it is possible to obtain the SFS realization of a given circuit by replacing each gate in it with its respective TSC version. We discuss the properties that a circuit must have in order to obtain its TSC realization in this manner using the TSC gate

Keywords

built-in self test; combinational circuits; fault diagnosis; logic CAD; logic gates; logic testing; network routing; AND gate; NAND gate; NOR gate; OR gate; SFS realization; TSC circuits; gate level description; multiple unidirectional stuck-at-fault model; routing; totally self-checking; two-rail code; universal TSC module; Adders; Boolean functions; Circuit faults; Circuit testing; Design methodology; Digital circuits; Electrical fault detection; Fault detection; Integrated circuit interconnections; Routing;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1995., Proceedings., Proceedings of the 38th Midwest Symposium on

Conference_Location

Rio de Janeiro

Print_ISBN

0-7803-2972-4

Type

conf

DOI

10.1109/MWSCAS.1995.510205

Filename

510205