DocumentCode
2209723
Title
Planning multiple levels constant stress accelerated life tests
Author
Loon-Ching Tang
Author_Institution
Nat. Univ. of Singapore
fYear
2002
fDate
2002
Firstpage
338
Lastpage
342
Abstract
The authors propose a method for planning constant stress accelerated life tests (CSALT) in which the departure from the usual optimality criterion can be quantified. The scheme is illustrated using three stress levels CSALT. In particular, a contour plot is developed to provide the solution space for sample allocation at high stress and the two lower stress levels. Based on the output from the contour plot, three related approaches for planning CSALT are then presented. Finally, a numerical example is used to illustrate the procedures
Keywords
life testing; planning; product development; reliability; contour plot; multiple levels constant stress accelerated life tests planning; optimality criterion; solution space; stress levels; Constraint optimization; Distribution functions; Life estimation; Life testing; Maintenance; Product development; Statistics; Stress; Uncertainty; Weibull distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2002. Proceedings. Annual
Conference_Location
Seattle, WA
ISSN
0149-144X
Print_ISBN
0-7803-7348-0
Type
conf
DOI
10.1109/RAMS.2002.981664
Filename
981664
Link To Document