DocumentCode
2209965
Title
Single Gate EPROM Cell for the End-of-line Ionic Contamination Test
Author
Mitros, Jozef C.
Author_Institution
SEMATECH/National Semiconductor Co.
fYear
1993
fDate
24-27 Oct 1993
Firstpage
40
Lastpage
44
Keywords
Capacitance-voltage characteristics; Contamination; Degradation; EPROM; Intrusion detection; MOSFETs; Passivation; Pollution measurement; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop Final Report, 1993 International
Type
conf
DOI
10.1109/IRWS.1993.666290
Filename
666290
Link To Document