• DocumentCode
    2210854
  • Title

    Electron beam disruption due to ion release from targets-comparison between computer calculations and observations

  • Author

    Hughes, T.P. ; Davis, H.A. ; Vermare, C. ; Moir, D.C. ; Olson, R.T. ; Wood, W.M.

  • Author_Institution
    Los Alamos Nat. Lab., NM, USA
  • fYear
    2002
  • fDate
    26-30 May 2002
  • Firstpage
    251
  • Abstract
    Summary form only given, as follows. Experiments have been performed on the first axis of the DARHT electron beam accelerator to study the effects on the beam of ion emission from surfaces struck by electrons. Calculations using the two-and three-dimensional Lsp particle-in-cell code were performed to compare with experimental results. Two-dimensional calculations, which allow the release of ions when the impacted surface temperature increases by 400 K accurately replicate experimental results showing beam blow-up downstream of the surface just after ion emission. Three-dimensional calculations show the onset of a hose instability after beam blow up in agreement with observations. The frequency of this instability indicates a large component of H/sup +/ ions, which may come from the "cracking" of desorbed water. Calculations in support of experiments to identify the desorbed species are presented.
  • Keywords
    electron beams; electron-surface impact; ion emission; plasma accelerators; plasma production; plasma-beam interactions; 400 K; DARHT electron beam accelerator; H/sup +/ ions; Lsp particle-in-cell code; beam blow-up; computer calculations; desorbed H/sub 2/O; electron beam disruption; impacted surface temperature; ion emission; ion release; surface ion emission; two-dimensional calculations; Electron accelerators; Electron beams; Electron emission; Ion accelerators; Ion beam effects; Ion beams; Ion emission; Particle accelerators; Particle beams; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2002. ICOPS 2002. IEEE Conference Record - Abstracts. The 29th IEEE International Conference on
  • Conference_Location
    Banff, Alberta, Canada
  • Print_ISBN
    0-7803-7407-X
  • Type

    conf

  • DOI
    10.1109/PLASMA.2002.1030524
  • Filename
    1030524