• DocumentCode
    2210897
  • Title

    Next-generation silicon analysis tools for RF integrated-circuits

  • Author

    Mehrotra, Amit ; Narayan, Amit ; Subramanian, Ravi

  • Author_Institution
    Berkeley Design Autom., Inc., Santa Clara, CA
  • fYear
    2006
  • fDate
    11-13 June 2006
  • Abstract
    This paper introduces new circuit analysis technology targeted to address the growing gap between what current circuit verification technology can deliver for today´s analog and RF integrated circuit designs, compared to what is observed and measured in silicon. We present key powerful new techniques for the precise and fast analysis and verification of RF integrated circuits. We also provide an overview of the key innovations in applied mathematics, numerical techniques, and software architecture that allow high speed and precision to be delivered together in circuit analysis. These techniques, taken together, comprise precision circuit analysis technology- targeted to address the growing verification problems found in the majority of today´s commercial analog/RF-rich integrated circuits. We demonstrate the application of this technology on commercially shipping designs in wireless, networking, and SoC applications
  • Keywords
    formal verification; network analysis; radiofrequency integrated circuits; silicon; RF integrated-circuits; Si; circuit analysis technology; circuit verification technology; silicon analysis tools; Circuit analysis; Current measurement; Integrated circuit measurements; Integrated circuit synthesis; Integrated circuit technology; Mathematics; Radio frequency; Radiofrequency integrated circuits; Silicon; Technological innovation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits (RFIC) Symposium, 2006 IEEE
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-9572-7
  • Type

    conf

  • DOI
    10.1109/RFIC.2006.1651167
  • Filename
    1651167