• DocumentCode
    2212348
  • Title

    Quantitative measurement of the degradation of EMI shielding and mating flange materials after environmental exposure

  • Author

    Lessner, Philip ; Inman, D.

  • Author_Institution
    Chomerics, Inc., Woburn, MA, USA
  • fYear
    1993
  • fDate
    9-13 Aug 1993
  • Firstpage
    207
  • Lastpage
    213
  • Abstract
    A test program that demonstrated that the electrical degradation of a conductive elastomer-aluminum flange joint could be determined using shielding effectiveness measurements is described. Two tests were developed. One measures the degradation of shielding effectiveness of a simulated gasketed enclosure seam (test set). Shielding effectiveness measurements are made at frequencies up to 10 GHz. The second test method yields a quantitative scale of conductive elastomer corrosivity (galvanic compatibility) and a quantitative measure of DC electrical degradation of the conductive elastomer. The tests demonstrated that a Ag-Al gasket/aluminum flange joint was more stable than a nickel-coated graphite gasket/aluminum flange joint after 192 h of sulfur dioxide salt fog exposure. This result reflects the greater stability of the Ag-Al gasket and the better galvanic compatibility of the Ag-Al gasket with the aluminum flange
  • Keywords
    conducting materials; elastomers; electromagnetic interference; electromagnetic shielding; environmental factors; materials testing; 10 GHz; 192 hr; Ag-Al; Al; DC electrical degradation; EMC; EMI shielding; Ni; SHF; conductive elastomer corrosivity; conductive elastomer-aluminum flange joint; electrical degradation; environmental exposure; galvanic compatibility; mating flange materials; quantitative measurement; shielding effectiveness measurements; simulated gasketed enclosure seam; sulfur dioxide salt fog exposure; test program; test set; Aluminum; Conductivity measurement; Degradation; Electric variables measurement; Electromagnetic interference; Flanges; Frequency measurement; Galvanizing; Gaskets; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1993. Symposium Record., 1993 IEEE International Symposium on
  • Conference_Location
    Dallas, TX
  • Print_ISBN
    0-7803-1304-6
  • Type

    conf

  • DOI
    10.1109/ISEMC.1993.473746
  • Filename
    473746