DocumentCode
2215068
Title
Analysis of thermal conductivity in Ni-doped CoSb3
Author
Kitagawa, Hiroyuki ; Wakatsuki, Machiko ; Isoda, Yukihiro ; Shinohara, Yoshikazu ; Hasezaki, Kazuhiro ; Noda, Yasutoshi
Author_Institution
Dept. of Mater. Sci., Shimane Univ., Matsue, Japan
fYear
2005
fDate
19-23 June 2005
Firstpage
449
Lastpage
452
Abstract
Co1-xNixSb3 (x = 0.005≈0.1) samples were prepared by direct melting of constituent elements in a graphite crucible and subsequently was sintered using spark plasma sintering. The temperature dependence of the Hall coefficient, Hall mobility, Seebeck coefficient, electrical resistivity and thermal conductivity were investigated in a temperature range from 20 to 773 K. All the measured samples are n-type semiconductor and the conduction type changes from n- to p-type at around 450 K. The temperature for the transition from n-type to p-type increased with increasing Ni content x. The scattering factor, Fermi energy and Lorenz number were estimated and thermal conductivity was analyzed as a function of temperature. The lattice component of thermal conductivity is dominant at low temperatures but carrier and bipolar components become large at temperatures higher than the transition temperature.
Keywords
Fermi level; Hall mobility; Seebeck effect; antimony alloys; cobalt alloys; electrical resistivity; melt processing; nickel; semiconductor materials; sintering; thermal conductivity; 20 to 773 K; Co1-xNixSb3; Fermi energy; Hall coefficient; Hall mobility; Lorenz number; Seebeck coefficient; direct melting; electrical resistivity; n-type semiconductor; p-type semiconductor; scattering factor; spark plasma sintering; thermal conductivity; Conductivity measurement; Electric resistance; Hall effect; Plasma measurements; Plasma temperature; Sparks; Temperature dependence; Temperature distribution; Thermal conductivity; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermoelectrics, 2005. ICT 2005. 24th International Conference on
ISSN
1094-2734
Print_ISBN
0-7803-9552-2
Type
conf
DOI
10.1109/ICT.2005.1519983
Filename
1519983
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