• DocumentCode
    2217052
  • Title

    A quasi-3D simulation for high-voltage level-shifting circuit by divided RESURF structure

  • Author

    Liu, Jizhi

  • Author_Institution
    State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2009
  • fDate
    25-27 Sept. 2009
  • Firstpage
    73
  • Lastpage
    76
  • Abstract
    A new quasi-3D simulation technique to verify the high-voltage level-shifting circuit by divided RESURF structure is proposed. It simulates the 3D performances of the structure by combining the devices paralleled to plane x-y and plane y-z with the circuit analysis advanced application module of Medici. The punch-through effect and parasitic n-MOST effect in the structure are analyzed and simulated. The results prove that only the parasitic n-MOST has been developed in this structure. The optimized parameters of the divided RESURF structure can be proposed to suppress the parasitic n-MOST effect. The quasi-3D simulation technique has many merits, such as computing quickly, no demand on the high-end computer terminals and operating easily.
  • Keywords
    circuit simulation; network analysis; 3D performance simulation; Medici; circuit analysis; divided RESURF structure; high-voltage level-shifting circuit; parasitic n-MOST effect; punch-through effect; quasi-3D simulation technique; Analytical models; Circuit analysis; Circuit simulation; Computational modeling; Driver circuits; Electromagnetic devices; Laboratories; Medical simulation; Superconductivity; Voltage; divided RESURF; level-shifting; quasi-3D;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Superconductivity and Electromagnetic Devices, 2009. ASEMD 2009. International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-3686-6
  • Electronic_ISBN
    978-1-4244-3687-3
  • Type

    conf

  • DOI
    10.1109/ASEMD.2009.5306690
  • Filename
    5306690