• DocumentCode
    2217300
  • Title

    Hole quantization and hole direct tunneling in deep submicron p-MOSFETs

  • Author

    Hou, Y.T. ; Li, M.-F. ; Jin, Y.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore
  • Volume
    2
  • fYear
    2001
  • fDate
    22-25 Oct. 2001
  • Firstpage
    895
  • Abstract
    Hole quantization is studied by a simple and efficient model based on the six-band effective mass approximation (EMA). Due to the valence band mixing effect, the traditional one-band EMA using effective mass values extracted from bulk Si underestimates the density of states and gives inaccurate results on the energy quantization. Furthermore, an improved one-band EMA, where effective mass values of energy quantization and density of states are empirically determined from the numerical results of six-band EMA (they are 0.29/1.16, 0.23/0.70, 0.23/0.60 m0), is proposed. In addition, its practical application to the modeling of quantum mechanical effects is also justified. Based on the hole quantization and using a Freeman-Dahlke hole dispersion in oxide band gap, the hole direct tunneling (DT) is also calculated and the results are in good agreement with the experiments.
  • Keywords
    MOSFET; effective mass; electronic density of states; energy gap; semiconductor device models; tunnelling; valence bands; EMA; Freeman-Dahlke hole dispersion; band gap; deep submicron p-MOSFETs; density of states; effective mass; hole direct tunneling; hole quantization; quantum mechanical effects; six-band effective mass approximation; valence band mixing effect; Computer aided manufacturing; Effective mass; Electronic mail; MOSFET circuits; Potential well; Quantization; Semiconductor device manufacture; Silicon; Tunneling; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on
  • Print_ISBN
    0-7803-6520-8
  • Type

    conf

  • DOI
    10.1109/ICSICT.2001.982039
  • Filename
    982039