DocumentCode
2220475
Title
Fault characterization of standard cell libraries using inductive contamination analysis (ICA)
Author
Khare, Jitendra ; Maly, Wojciech ; Tiday, Nathan
Author_Institution
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear
1996
fDate
28 Apr-1 May 1996
Firstpage
405
Lastpage
413
Abstract
In this paper we demonstrate an Inductive Contamination Analysis (ICA)-based methodology for complete fault characterization of standard cell libraries. Such a characterization has applications in accurate assessment of defect coverage, contamination diagnosis, gate-level delay characterization and test generation
Keywords
cellular arrays; fault diagnosis; integrated circuit testing; surface contamination; contamination diagnosis; defect coverage; fault characterization; gate-level delay characterization; inductive contamination analysis; standard cell libraries; test generation; Boolean functions; Circuit faults; Contamination; Delay estimation; Failure analysis; Fault diagnosis; Independent component analysis; Integrated circuit testing; Libraries; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location
Princeton, NJ
ISSN
1093-0167
Print_ISBN
0-8186-7304-4
Type
conf
DOI
10.1109/VTEST.1996.510886
Filename
510886
Link To Document