• DocumentCode
    2220667
  • Title

    Isomorph-redundancy in sequential circuits

  • Author

    Das, Debesh K. ; Bhattacharya, Uttam K. ; Bhattacharya, Bhargab B.

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Jadavpur Univ., Calcutta, India
  • fYear
    1996
  • fDate
    28 Apr-1 May 1996
  • Firstpage
    463
  • Lastpage
    468
  • Abstract
    An isomorph fault in a sequential circuit makes the state diagram of the faulty machine identical to that of the fault-free machine, under the renaming of states. However, no example of a reduced sequential machine whose circuit realization is combinationally irredundant but isomorph-redundant, is yet known. This paper shows that an infinite family of such circuits can be constructed with isomorph-redundancy. Isomorph faults are then classified into various types. Their properties reveal new insight and understanding of redundancy in sequential circuits
  • Keywords
    VLSI; design for testability; integrated circuit testing; logic design; logic testing; redundancy; sequential circuits; DFT; infinite family; isomorph-redundancy; reduced sequential machine; sequential circuits; state diagram; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Hardware; Logic design; Logic testing; Redundancy; Sequential analysis; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1996., Proceedings of 14th
  • Conference_Location
    Princeton, NJ
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-7304-4
  • Type

    conf

  • DOI
    10.1109/VTEST.1996.510894
  • Filename
    510894