Implicit functional testing for analog circuits

We propose an efficient approach to functional testing for linear time-invariant (LTI) analog circuits. By using proper signatures (impulse response samples) to infer the satisfaction/violation of the specifications for the performance parameters (we call such a procedure implicit functional testing), we can achieve over 90% fault and yield coverages based on only a small number of signatures. We use the pseudo-random technique to estimate the impulse response samples. Our approach is effective in terms of costs of test equipments and production testing time. We also present simulation results to illustrate the effects of the randomness of the estimated impulse response samples on the fault and yield coverages