DocumentCode
2224623
Title
Integrating bottom-up/top-down for object recognition by data driven Markov chain Monte Carlo
Author
Zhu, Song-Chun ; Zhang, Rong ; Tu, Zhuowen
Author_Institution
Dept. of Comput. & Inf. Sci., Ohio State Univ., Columbus, OH, USA
Volume
1
fYear
2000
fDate
2000
Firstpage
738
Abstract
This article presents a mathematical paradigm called Data Driven Markov Chain Monte Carlo (DDMCMC) for object recognition. The objectives of this paradigm are two-fold. Firstly, it realizes traditional “hypothesis-and-test” methods through well-balanced Markov chain Monte Carlo (MCMC) dynamics, thus it achieves robust and globally optimal solutions. Secondly, it utilizes data-driven (bottom-up) methods in computer vision, such as Hough transform and data clustering, to design effective transition probabilities for Markov chain dynamics. This drastically improves the effectiveness of traditional MCMC algorithms in terms of two standard metrics: “burn-in” period and “mixing” rate. The article proceeds in three steps. Firstly, we analyze the structures of the solution space Ω for object recognition. Ω is decomposed into a large number of subspaces of varying dimensions in a hierarchy. Secondly, we use data-driven techniques to compute importance proposal probabilities in these spaces, each expressed in a non-parametric form using weighted samples or particles. Thirdly, Markov chains are designed to travel in such heterogeneous structured solution space, with both jump and diffusion dynamics. We use possibly the simplest objects-the “Ψ-world” as an example to illustrate the concepts, and we briefly present results on an application of traffic sign detection
Keywords
Hough transforms; Markov processes; Monte Carlo methods; computer vision; object recognition; Data Driven Markov Chain Monte Carlo; Hough transform; Markov chain; Monte Carlo; bottom-up; computer vision; data clustering; data driven; object recognition; Monte Carlo methods; Object recognition;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition, 2000. Proceedings. IEEE Conference on
Conference_Location
Hilton Head Island, SC
ISSN
1063-6919
Print_ISBN
0-7695-0662-3
Type
conf
DOI
10.1109/CVPR.2000.855894
Filename
855894
Link To Document