Performance analysis of sampling switch structures for wideband sigma-delta noise shapers for RF applications

Author

Gothenberg, A. ; Tenhunen, H.

Author_Institution

Dept. of Microelectron. & Inf. Technol., R. Inst. of Technol., Stockholm, Sweden

fYear

2001

fDate

2001

Firstpage

220

Lastpage

223

Abstract

The sampling switch of a wideband sigma-delta noise shaper for RF applications is a very critical component as any nonlinearities within reduces the spurious free dynamic range, SFDR, of the whole modulator. Errors due to nonlinearities are carried on to all other processing stages. The analysis investigates a variety of sampling switches. It is found that apart from insignificant dependence of input voltage level the bootstrap sampling switch also has a significant higher SFDR over the entire bandwidth

Keywords

CMOS integrated circuits; bootstrap circuits; cellular radio; digital radio; sigma-delta modulation; signal sampling; CMOS; DCS; GSM; RF applications; SFDR; bootstrap sampling switch; input voltage level; mobile radio systems; nonlinearities; sampling switch structures; spurious free dynamic range; wideband sigma-delta noise shapers; Delta-sigma modulation; Dynamic range; Noise reduction; Noise shaping; Performance analysis; Radio frequency; Sampling methods; Switches; Voltage; Wideband;

fLanguage

English

Publisher

ieee

Conference_Titel

ASIC, 2001. Proceedings. 4th International Conference on

Conference_Location

Shanghai

Print_ISBN

0-7803-6677-8

Type

conf

DOI

10.1109/ICASIC.2001.982537

Filename

982537