• DocumentCode
    2224945
  • Title

    Alignment Distance in Path Control

  • Author

    Tran, Nghia ; Rohrer, Brandon ; Warnick, Sean

  • Author_Institution
    Brigham Young Univ., Provo
  • fYear
    2007
  • fDate
    1-3 Oct. 2007
  • Firstpage
    1468
  • Lastpage
    1473
  • Abstract
    In this paper we discuss alignment distance for measuring path deviation between curves. We compare properties of the alignment distance to both p-norms and the Haus-dorff distance to argue its superiority for use in path following problems. While problems of finding an optimal parameterization of a fixed input curve to a tracking system are not new, typical formulations focus on parameterizations that minimize transversal time while respecting certain system constraints; on-line governors can then be employed that choose a path velocity in real time, trading off computational complexity and time-optimality. By explicitly characterizing the error measure implicit in path control problems, we revisit the off-line, open loop parameterization problem to explore the inherit tradeoffs between command shape, command parameterization, and system dynamics. The utility of the alignment distance as a tool for elucidating these fundamental tradeoffs is demonstrated on a simple PD-controlled mass system.
  • Keywords
    PD control; computational complexity; computational geometry; minimisation; mobile robots; open loop systems; optimal control; path planning; position control; tracking; velocity control; Hausdorff distance; PD-controlled mass system; alignment distance; computational complexity; open loop parameterization problem; optimal parameterization; path deviation control; path following problem; path velocity; tracking system; transversal time minimization; Application software; Control systems; Intelligent robots; Laboratories; Open loop systems; Regulators; Shape control; Shape measurement; Tracking loops; Trajectory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control Applications, 2007. CCA 2007. IEEE International Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-0442-1
  • Electronic_ISBN
    978-1-4244-0443-8
  • Type

    conf

  • DOI
    10.1109/CCA.2007.4389443
  • Filename
    4389443