• DocumentCode
    2225852
  • Title

    Temperature vs. Reliability for Hardened Systems in Substations

  • Author

    Hammond, Jim

  • fYear
    2006
  • fDate
    15-19 Oct. 2006
  • Abstract
    Electronics cooling is getting increased attention as intelligent systems integrating higher-density components migrate into industrial settings. Product designs need to adapt to harsher conditions than the traditional office environments. Available component temperature ratings are rising, but factors such as component high-heat generation and device packaging density are leading to higher-temperature operating conditions, thus offsetting the gains in heat immunity. This paper evaluates thermal design trade-offs related to reliability and offers some insights worth considering in the design and deployment of industrial systems.
  • Keywords
    cooling; forced convection; product design; reliability; substations; component high-heat generation; convection cooling; device packaging; electronics cooling; hardened systems; industrial systems; intelligent systems; product designs; rugged systems; thermal design; Electronic packaging thermal management; Electronics cooling; Electronics industry; Intelligent systems; Product design; Reliability engineering; Substations; System testing; Systems engineering and theory; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Transmission & Distribution Construction, Operation and Live-Line Maintenance, 2006. ESMO 2006. IEEE 11th International Conference on
  • Conference_Location
    Albuquerque, NM
  • Print_ISBN
    1-4244-0724-9
  • Electronic_ISBN
    1-4244-0724-9
  • Type

    conf

  • DOI
    10.1109/TDCLLM.2006.340740
  • Filename
    4144508