• DocumentCode
    2227898
  • Title

    A cure rate model in reliability for complex system

  • Author

    Lin, J. ; Zhu, H.M.

  • Author_Institution
    Dept. of AMS, SKF China Ltd., Beijing, China
  • fYear
    2008
  • fDate
    8-11 Dec. 2008
  • Firstpage
    1395
  • Lastpage
    1399
  • Abstract
    This paper presents a new approach to do reliability analysis for complex system, where a certain fraction of the subsystems is defined as a ¿cure fraction¿ under the consideration that such subsystems are ¿longevous¿ compared with the entire system. Including introducing environment covariates and the joint power prior, the proposed model is developed with the Bayesian survival analysis method, and thus the problems for censored (or truncated) data in reliability tests can be resolved. In addition, a Markov chain Monte Carlo method based on Gibbs sampling is used to dynamically simulate the Markov chain of the parameters¿ posterior distribution. Finally, a numeric example is discussed to demonstrate the proposed model.
  • Keywords
    Bayes methods; Markov processes; Monte Carlo methods; reliability theory; Bayesian survival analysis method; Gibbs sampling; Markov chain Monte Carlo method; complex system reliability; cure rate model; environment covariates; parameter posterior distribution; Bayesian methods; Biological system modeling; Educational institutions; Hazards; Interference; Power system modeling; Power system reliability; Random variables; Sampling methods; Testing; Bayesian survival analysis; Gibbs sampler; Markov chain Monte Carlo; cure rate model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management, 2008. IEEM 2008. IEEE International Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-2629-4
  • Electronic_ISBN
    978-1-4244-2630-0
  • Type

    conf

  • DOI
    10.1109/IEEM.2008.4738099
  • Filename
    4738099