DocumentCode
2228088
Title
Toward the matrix polarimetry method of thin film coatings
Author
Pidkamin, L.J. ; Arkhelyuk, A.D. ; Brus, V.V.
Author_Institution
Chernivtsi Nat. Univ. of Yo.Fedcovicha, Russia
fYear
2011
fDate
12-16 Sept. 2011
Firstpage
727
Lastpage
728
Abstract
The results obtained from studying the impact of optical-geometrical parameters of thin-layered models containing the particles of different shapes and sizes as well as the degree of orient ability toward their light scattering matrices how been analyzed. A special emphasis is placed upon the peculiar aspects of the matrix polarimetry method and it is in fact expedient to use this technique in implementing and developing the non-destructive methods to control thin film coatings.
Keywords
coatings; light scattering; nondestructive testing; particle size; polarimetry; thin films; light scattering; matrix polarimetry method; nondestructive methods; optical-geometrical parameters; particle shape; particle size; thin film coatings; thin-layered models; Coatings; Optical films; Optical imaging; Optical polarization; Optical scattering; Shape; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Telecommunication Technology (CriMiCo), 2011 21th International Crimean Conference
Conference_Location
Sevastopol
Print_ISBN
978-1-4577-0883-1
Type
conf
Filename
6069127
Link To Document