DocumentCode
2231728
Title
Scheduling Semiconductor Manufacturing Plants to Reduce Mean and Variance of Cycle-Time
Author
Lu, Steve C H ; Ramaswamy, Deepa ; Kumar, P.R.
Author_Institution
University of Illinois
fYear
1993
fDate
18-19 Oct 1993
Firstpage
83
Lastpage
85
Keywords
Fabrication; Fluctuations; Job shop scheduling; Manufacturing systems; Semiconductor device manufacture; Semiconductor device testing; Smoothing methods; System testing; Traffic control; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference and Workshop, 1993. ASMC 93 Proceedings. IEEE/SEMI
Type
conf
DOI
10.1109/ASMC.1993.682485
Filename
682485
Link To Document