• DocumentCode
    2233442
  • Title

    A cross-check test scheme for infrared focal plane array

  • Author

    Sheu, Meng Lieh ; Shie, Man Chau ; Sun, Tai Ping ; Jih, Far Wen

  • Author_Institution
    National Chi-Nan University
  • fYear
    2002
  • fDate
    8-8 Aug. 2002
  • Firstpage
    109
  • Lastpage
    112
  • Keywords
    Built-in self-test; CMOS technology; Circuit testing; Dark current; Electronic equipment testing; Infrared detectors; Photovoltaic systems; Radiation detectors; Sensor arrays; Solar power generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2002. Proceedings. 2002 IEEE Asia-Pacific Conference on
  • Conference_Location
    Taipei, Taiwan
  • Print_ISBN
    0-7803-7363-4
  • Type

    conf

  • DOI
    10.1109/APASIC.2002.1031544
  • Filename
    1031544
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2233442