• DocumentCode
    2233476
  • Title

    Composition dependence of xBiFeO3-(1-x)PbTiO3 films prepared by sol-gel technique

  • Author

    Yuan, Bingrong ; Yu, Shengwen ; Yang, Wufeng ; Zhou, Xiaowen ; Cheng, Jinrong

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Shanghai Univ., Shanghai, China
  • fYear
    2009
  • fDate
    23-27 Aug. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Bismuth ferrite and lead titanate composite multiferroic films (xBiFeO3-(1-x)PbTiO3, BFO-PT films) were deposited on Pt/Ti/SiO2/Si substrates by sol-gel method. In this report, the value of x varies from 0.5 to 0.8. The composition dependence (dependence of x) of BFO-PT films is studied. X-ray diffraction analysis reveals that all films are well crystallized in tetragonal phase. It discovers that enhanced ferroelectricity and decreased coercive field can be obtained by reducing the content of BFO (decreasing x). Film for x=0.7 shows the optimized properties, with a very low leakage density about 3.3 times 10-7 A/cm2 at 100 kV/cm, maintaining the values of remanent polarization of 35.5 muC/cm2 and coercive field of 165 kV/cm at 680 kv/cm at room temperature.
  • Keywords
    X-ray diffraction; bismuth compounds; dielectric polarisation; ferroelectric coercive field; ferroelectric thin films; lead compounds; multiferroics; sol-gel processing; BiFeO3-PbTiO3; Pt-Ti-SiO2-Si; Si; X-ray diffraction analysis; bismuth ferrite; coercive field; ferroelectricity; lead titanate composite multiferroic films; leakage density; remanent polarization; sol-gel technique; temperature 293 K to 298 K; tetragonal phase; Bismuth; Crystallization; Ferrite films; Ferroelectric films; Polarization; Semiconductor films; Substrates; Temperature; Titanium compounds; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2009. ISAF 2009. 18th IEEE International Symposium on the
  • Conference_Location
    Xian
  • ISSN
    1099-4734
  • Print_ISBN
    978-1-4244-4970-5
  • Electronic_ISBN
    1099-4734
  • Type

    conf

  • DOI
    10.1109/ISAF.2009.5307556
  • Filename
    5307556