Experiments investigating the effects of the accelerating gap voltage pulse on the ion focused (IFR) high current electron recirculators

Author

Mazarakis, M.G. ; Smith, D.L. ; Poukey, J.W. ; Wagner, J.S. ; Bennett, L.F. ; Olson, W.R. ; Turman, B.N. ; Prestwich, K.R. ; Wells, J.

Author_Institution

Sandia Nat. Lab., Albuquerque, NM, USA

fYear

1991

fDate

6-9 May 1991

Firstpage

3126

Abstract

The authors have established experimentally that pulsing the accelerating gap of the ET-2 cavity puts the electrons and ions of the ion focusing regime (IFR) plasma channel into motion. As a result of the electron motion, two types of disturbances propagate axially into opposite directions: (1) electrons move to the left of the gap, and (2) a sheath moves to the right (direction of gap electric field). Both disturbances cause the Rogowski coils to register a 200-300-A current in the same direction. The argon ions of the IFR channel escape radially with velocities equal to 1.2*10/sup 7/ cm/s and take 400 ns to hit the 5-cm-radius pipe. Cusp magnetic fields or possibly transparent grids upstream and downstream from the accelerating gap can decouple it from the IFR channel.<>

Keywords

beam handling equipment; focusing; ion accelerators; ET-2 cavity; IFR channel; Rogowski coils; accelerating gap voltage pulse; cusp magnetic fields; electron motion; high current electron recirculators; ion focused recirculators; ion focusing regime; plasma channel; transparent grids; Acceleration; Argon; Electron beams; Geometry; Laboratories; Linear accelerators; Particle beams; Plasma accelerators; Spirals; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Particle Accelerator Conference, 1991. Accelerator Science and Technology., Conference Record of the 1991 IEEE

Conference_Location

San Francisco, CA, USA

Print_ISBN

0-7803-0135-8

Type

conf

DOI

10.1109/PAC.1991.165209

Filename

165209