• DocumentCode
    2235553
  • Title

    Web-based database for facial expression analysis

  • Author

    Pantic, Maja ; Valstar, Michel ; Rademaker, Ron ; Maat, Ludo

  • Author_Institution
    EEMCS/Man-Machine Interaction Group, Delft Univ. of Technol., Netherlands
  • fYear
    2005
  • fDate
    6-8 July 2005
  • Abstract
    In the last decade, the research topic of automatic analysis of facial expressions has become a central topic in machine vision research. Nonetheless, there is a glaring lack of a comprehensive, readily accessible reference set of face images that could be used as a basis for benchmarks for efforts in the field. This lack of easily accessible, suitable, common testing resource forms the major impediment to comparing and extending the issues concerned with automatic facial expression analysis. In this paper, we discuss a number of issues that make the problem of creating a benchmark facial expression database difficult. We then present the MMI facial expression database, which includes more than 1500 samples of both static images and image sequences of faces in frontal and in profile view displaying various expressions of emotion, single and multiple facial muscle activation. It has been built as a Web-based direct-manipulation application, allowing easy access and easy search of the available images. This database represents the most comprehensive reference set of images for studies on facial expression analysis to date.
  • Keywords
    Internet; distributed databases; emotion recognition; face recognition; image representation; image sequences; visual databases; MMI facial expression database; Web-based direct-manipulation application; image representation; image sequence; man-machine interaction; multiple facial muscle activation; static image; Benchmark testing; Face detection; Facial muscles; Humans; Image analysis; Image databases; Machine vision; Man machine systems; Signal analysis; Videos;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia and Expo, 2005. ICME 2005. IEEE International Conference on
  • Print_ISBN
    0-7803-9331-7
  • Type

    conf

  • DOI
    10.1109/ICME.2005.1521424
  • Filename
    1521424