DocumentCode
2241669
Title
Accuracy of distance measurement based on two-photon absorption of Si-photodetector
Author
Oiwa, Takaaki ; Shioda, Tatsutoshi ; Tanaka, Yuichi ; Takeda, Masanori
Author_Institution
Graduate Sch. of Eng., Tokyo Univ. of Agric. & Technol., Tokyo
fYear
2007
fDate
26-31 Aug. 2007
Firstpage
1
Lastpage
2
Abstract
We have successfully measured a space distance with the accuracy of less than 10-5 based on TPA process in a silicon photodetector. The two signal processing technologies including the Fourier transform method and the curve fitting method were investigated.
Keywords
Fourier transforms; curve fitting; distance measurement; elemental semiconductors; photodetectors; silicon; two-photon processes; Fourier transform; Si; curve fitting; distance measurement; signal processing; silicon photodetector; two-photon absorption; Absorption; Distance measurement; Frequency modulation; Optical fiber couplers; Optical modulation; Optical signal processing; Photoconductivity; Photodetectors; Silicon; Space technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics - Pacific Rim, 2007. CLEO/Pacific Rim 2007. Conference on
Conference_Location
Seoul
Print_ISBN
978-1-4244-1173-3
Electronic_ISBN
978-1-4244-1174-0
Type
conf
DOI
10.1109/CLEOPR.2007.4391290
Filename
4391290
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