• DocumentCode
    2242156
  • Title

    Effect of die attach adhesive defects on the junction temperature uniformity of LED chips

  • Author

    Mian Tao ; Lee, S. W. Ricky ; Yuen, M.M.F. ; Guoqi Zhang ; van Driel, W.

  • Author_Institution
    Electron. Mater. & Packaging Lab., HKUST, Shenzhen, China
  • fYear
    2012
  • fDate
    6-8 Nov. 2012
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    In the literature, the junction temperature of a light-emitting diode (LED) has been considered having a uniform distribution over the whole chip. Such a perception is based on the assumption that the die attach adhesive (DAA) covers the whole bottom of the LED chip with a uniform thickness. However, in reality, there may be insufficient DAA during the chip mounting process. As a result, non-uniform junction temperature may be induced and hot spots could occur. Therefore, it is essential to investigate the effect of DAA on the creation of hot spots at the LED junction. In the present study, LED chips were mounted with various amounts of DAA on a leadframe designed for high power LED. A high resolution infra-red (IR) camera was used to measure the temperature on the surface of the LED chip. The obtained IR images were calibrated carefully in order to eliminate the influence from IR emissivity. Hot spots were observed at the junction areas where DAA was missing. Detailed analysis for illustrating the effect of DAA distribution on hot spots is presented and reasons for such a phenomenon are discussed.
  • Keywords
    adhesive bonding; infrared imaging; integrated circuit packaging; integrated optoelectronics; light emitting diodes; microassembling; temperature distribution; temperature measurement; thermal management (packaging); LED chips; LED junction hot spot; chip mounting process; die attach adhesive defect; high resolution infrared camera; infrared images; junction temperature uniformity; light emitting diode; nonuniform junction temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium (IEMT), 2012 35th IEEE/CPMT International
  • Conference_Location
    Ipoh
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4673-4384-8
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2012.6521830
  • Filename
    6521830