• DocumentCode
    2242696
  • Title

    Sequential Variations of Fraunhofer Diffraction Pattern by Optical 4f Imaging System in As2S3 Thin Film

  • Author

    Yang, H.R. ; Kim, E.J. ; Kim, G.Y. ; Park, S.Y. ; Kwak, C.H.

  • Author_Institution
    Dept. of Phys., Yeungnam Univ., Kyongsan
  • fYear
    2007
  • fDate
    26-31 Aug. 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We observed sequential changes of Fraunhofer diffraction pattern due to photoinduced nonlinear refractive index changes in chalcogenide amorphous AS2S3 thin film by utilizing the optical 4f imaging system and also measured the power distribution of the temporal observed patterns.
  • Keywords
    Fraunhofer diffraction; optical films; optical images; refractive index; As2S3; Fraunhofer diffraction pattern; chalcogenide amorphous thin film; optical 4f imaging system; photoinduced nonlinear refractive index; sequential variations; temporal observed pattern; Amorphous materials; Nonlinear optics; Optical diffraction; Optical films; Optical imaging; Optical refraction; Optical variables control; Power distribution; Power measurement; Refractive index;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics - Pacific Rim, 2007. CLEO/Pacific Rim 2007. Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-1173-3
  • Electronic_ISBN
    978-1-4244-1174-0
  • Type

    conf

  • DOI
    10.1109/CLEOPR.2007.4391332
  • Filename
    4391332
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2242696