DocumentCode
2243449
Title
3D structuring of c-Si using porous silicon as sacrificial material
Author
Mescheder, U.M. ; Kovacs, A. ; Fahad, A. ; Huster, R.
Author_Institution
Dept. of Comput. & Electr. Eng., Univ. of Appl. Sci. Furtwangen, Germany
fYear
2002
fDate
2002
Firstpage
33
Lastpage
36
Abstract
A new three dimensional structuring technique for crystalline silicon is investigated. Using porous Si with a typical pore size of a few nanometers three dimensional shapes can be formed. The shape of the structures is provided by an anodisation process in which crystalline Si is transformed to nanoporous Si. Control of the local depth of the 3D structures is achieved by appropriate 2D masking structures and the resulting current density distribution. Thus the process allows the transfer of a 2D pattern into a 3D structure in a single step. Subsequent electro-polishing provides optically smooth surfaces of the etched structures which makes this technique interesting for micromold applications e.g. for the fabrication of optical elements.
Keywords
anodisation; current density; electrolytic polishing; elemental semiconductors; etching; masks; micro-optics; micromachining; nanostructured materials; nanotechnology; optical fabrication; porous semiconductors; silicon; surface topography; 2D masking structures; 3D structuring; Si; anodisation; c-Si; crystalline silicon; current density distribution; electro-polishing; etched structures; local depth; micromold applications; nanoporous Si; optical elements; optically smooth surfaces; pore size; porous Si; porous silicon; sacrificial material; three dimensional structuring technique; Anisotropic magnetoresistance; Crystalline materials; Crystallization; Current density; Etching; Lithography; Optical films; Plastics; Shape control; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2002. IEEE-NANO 2002. Proceedings of the 2002 2nd IEEE Conference on
Print_ISBN
0-7803-7538-6
Type
conf
DOI
10.1109/NANO.2002.1032117
Filename
1032117
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