• DocumentCode
    2243449
  • Title

    3D structuring of c-Si using porous silicon as sacrificial material

  • Author

    Mescheder, U.M. ; Kovacs, A. ; Fahad, A. ; Huster, R.

  • Author_Institution
    Dept. of Comput. & Electr. Eng., Univ. of Appl. Sci. Furtwangen, Germany
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    33
  • Lastpage
    36
  • Abstract
    A new three dimensional structuring technique for crystalline silicon is investigated. Using porous Si with a typical pore size of a few nanometers three dimensional shapes can be formed. The shape of the structures is provided by an anodisation process in which crystalline Si is transformed to nanoporous Si. Control of the local depth of the 3D structures is achieved by appropriate 2D masking structures and the resulting current density distribution. Thus the process allows the transfer of a 2D pattern into a 3D structure in a single step. Subsequent electro-polishing provides optically smooth surfaces of the etched structures which makes this technique interesting for micromold applications e.g. for the fabrication of optical elements.
  • Keywords
    anodisation; current density; electrolytic polishing; elemental semiconductors; etching; masks; micro-optics; micromachining; nanostructured materials; nanotechnology; optical fabrication; porous semiconductors; silicon; surface topography; 2D masking structures; 3D structuring; Si; anodisation; c-Si; crystalline silicon; current density distribution; electro-polishing; etched structures; local depth; micromold applications; nanoporous Si; optical elements; optically smooth surfaces; pore size; porous Si; porous silicon; sacrificial material; three dimensional structuring technique; Anisotropic magnetoresistance; Crystalline materials; Crystallization; Current density; Etching; Lithography; Optical films; Plastics; Shape control; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2002. IEEE-NANO 2002. Proceedings of the 2002 2nd IEEE Conference on
  • Print_ISBN
    0-7803-7538-6
  • Type

    conf

  • DOI
    10.1109/NANO.2002.1032117
  • Filename
    1032117