Effect of heat treatment on the interfacial adhesion strength between Sn-Zn-xAg lead-free solders and Cu substrate

Author

Chang, Tao-Chih ; Hon, Min-Hsiung ; Chang, Chin-Hui ; Wang, Moo-Chin

Author_Institution

Dept. of Mater. Sci. & Eng., Nat. Cheng Kung Univ., Tainan, Taiwan

fYear

2001

fDate

2001

Firstpage

216

Lastpage

218

Abstract

Sn-9Zn eutectic solder alloy is a potential candidate to replace 63Sn-37Pb alloy as interconnecting material in the electronic packaging industry, but the inferior wettability and poor oxidation resistance make this alloy unsuitable for wide application. In this study, different Ag contents were added to the Sn-9Zn alloy to improve the wettability, oxidation resistance, and adhesion strength at the interface. A pull-off test was used to estimate the adhesion strength of the interface between Sn-Zn-xAg solders and Cu substrates, scanning electron microscopy (SEM) was utilized to observe the fracture morphology, and energy dispersive spectrum (EDS) was employed to analyze the distribution of elements. Finally, X-ray diffraction (XRD) was exploited to identify the intermetallic compounds (IMCs) formed at the interface

Keywords

X-ray chemical analysis; X-ray diffraction; adhesion; assembling; environmental factors; failure analysis; fracture; heat treatment; interconnections; interface structure; mechanical testing; oxidation; packaging; scanning electron microscopy; silver alloys; soldering; tin alloys; wetting; zinc alloys; Cu; Cu substrate; EDS; IMCs; SEM; Sn-Pb; Sn-Pb solder alloy replacement; Sn-Zn; Sn-Zn eutectic solder alloy; Sn-Zn-Ag lead-free solders; SnZnAg-Cu; X-ray diffraction; XRD; adhesion strength; energy dispersive spectrum; fracture morphology; heat treatment; interface intermetallic compounds; interfacial adhesion strength; oxidation resistance; pull-off test; scanning electron microscopy; solder Ag content; wettability; Adhesives; Dispersion; Electronics industry; Electronics packaging; Heat treatment; Morphology; Oxidation; Scanning electron microscopy; Testing; X-ray diffraction;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Materials and Packaging, 2001. EMAP 2001. Advances in

Conference_Location

Jeju Island

Print_ISBN

0-7803-7157-7

Type

conf

DOI

10.1109/EMAP.2001.983987

Filename

983987