A Method for the Correction of N-Ports Scattering Parameters Measurement

Author

Zhao, Baishan ; Zhu, Yi-Sheng

Author_Institution

Coll. of Inf. Eng., Dalian Maritime Univ.

fYear

2006

fDate

4-7 Dec. 2006

Firstpage

1639

Lastpage

1642

Abstract

In this paper, a method used to reduce the errors in the scattering parameters measurement of N-ports based on two-port vector network analyzer (VNA) is presented, which is based on the normalization and renormalization of the scattering matrix, formulated equations are introduced to correct the reflective parameters of terminations according to the transformed scattering matrices, and an optimization procedure is given to precise the values of reflective parameters, the errors of the scattering parameters can be reduced for the corrected reflective parameters. The corrected method is proved by measured results

Keywords

S-parameters; network analysers; two-port networks; N-ports scattering parameters measurement; reflective parameters; scattering matrix normalization; scattering matrix renormalization; transformed scattering matrices; two-port vector network analyzer; Educational institutions; Electronic mail; Equations; Error correction; Impedance; Information analysis; Optimization methods; Performance analysis; Performance evaluation; Scattering parameters; normalization; reflective parameter; scattering parameter;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2006. APCCAS 2006. IEEE Asia Pacific Conference on

Conference_Location

Singapore

Print_ISBN

1-4244-0387-1

Type

conf

DOI

10.1109/APCCAS.2006.342079

Filename

4145723