DocumentCode
2248788
Title
Power switching semiconductor models for PSpice, and their parametric sensitivity analysis
Author
He, X. ; Williams, B.W. ; Green, T.C.
Author_Institution
Zhejiang Univ., Hangzhou, China
fYear
1994
fDate
26-28 Oct 1994
Firstpage
543
Lastpage
549
Abstract
PSpice models for power semiconductor switching devices, which include the gate turn-off thyristor, the insulated gate bipolar transistor and the MOS-controlled thyristor, are presented. These models are suitable for time domain circuit simulation packages which incorporate bipolar transistor and metal oxide semiconductor field effect transistor models. The models presented are composite models, being built-up-from these two basic switching components. Simulation, experimentation results and parametric sensitivity analysis validate the in-circuit performance of the proposed composite models. The presented models are meant for applications where circuit level simulated performance is of primary importance, rather than accurate prediction of device microscopic electrical characteristics
Keywords
MOS-controlled thyristors; digital simulation; electronic engineering computing; equivalent circuits; insulated gate bipolar transistors; power bipolar transistors; power engineering computing; power semiconductor switches; semiconductor device models; MOS-controlled thyristor; PSpice; composite models; gate turn-off thyristor; insulated gate bipolar transistor; parametric sensitivity analysis; power semiconductor switching devices; time domain circuit simulation;
fLanguage
English
Publisher
iet
Conference_Titel
Power Electronics and Variable-Speed Drives, 1994. Fifth International Conference on
Conference_Location
London
Type
conf
DOI
10.1049/cp:19941023
Filename
341651
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