• DocumentCode
    2248788
  • Title

    Power switching semiconductor models for PSpice, and their parametric sensitivity analysis

  • Author

    He, X. ; Williams, B.W. ; Green, T.C.

  • Author_Institution
    Zhejiang Univ., Hangzhou, China
  • fYear
    1994
  • fDate
    26-28 Oct 1994
  • Firstpage
    543
  • Lastpage
    549
  • Abstract
    PSpice models for power semiconductor switching devices, which include the gate turn-off thyristor, the insulated gate bipolar transistor and the MOS-controlled thyristor, are presented. These models are suitable for time domain circuit simulation packages which incorporate bipolar transistor and metal oxide semiconductor field effect transistor models. The models presented are composite models, being built-up-from these two basic switching components. Simulation, experimentation results and parametric sensitivity analysis validate the in-circuit performance of the proposed composite models. The presented models are meant for applications where circuit level simulated performance is of primary importance, rather than accurate prediction of device microscopic electrical characteristics
  • Keywords
    MOS-controlled thyristors; digital simulation; electronic engineering computing; equivalent circuits; insulated gate bipolar transistors; power bipolar transistors; power engineering computing; power semiconductor switches; semiconductor device models; MOS-controlled thyristor; PSpice; composite models; gate turn-off thyristor; insulated gate bipolar transistor; parametric sensitivity analysis; power semiconductor switching devices; time domain circuit simulation;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Power Electronics and Variable-Speed Drives, 1994. Fifth International Conference on
  • Conference_Location
    London
  • Type

    conf

  • DOI
    10.1049/cp:19941023
  • Filename
    341651