• DocumentCode
    2249866
  • Title

    Effect of snow wetness to C-band backscatter-a modeling approach

  • Author

    Koskinen, Jarkko ; Pulliainen, Jouni ; Hallikainen, Martti

  • Author_Institution
    Finnish Environ. Inst., Helsinki, Finland
  • Volume
    4
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1754
  • Abstract
    Snow cover has a substantial impact on processes regarding the interaction between atmosphere and surface; thus, the knowledge of snow parameters is important for climatology, meteorology, flood prevention and the hydropower industry. The applicability of active microwave remote sensing for snow monitoring has been investigated for years. However, none has analyzed the effect of various snow characteristics to the accuracy of SAR-based snow extent estimation during the melting season. Previous studies have mainly shown results obtained by comparing SAR derived snow extent estimates with ground surveys. This paper presents a simple snow backscattering model and its combination with the semi-empirical forest backscattering model. The model is validated with HUTSCAT scatterometer and ERS-I measurements conducted in the Sodankyla test site. With the model predictions the effect of several parameters affecting the accuracy of snow extent monitoring by radar is analyzed
  • Keywords
    backscatter; hydrological techniques; radar cross-sections; radar theory; remote sensing by radar; snow; synthetic aperture radar; terrain mapping; C-band; SAR; SHF; Sodankyla test site; backscatter; backscattering model; forest; hydrology; land surface; measurement technique; melting season; model; radar remote sensing; snow cover; snow extent; snow wetness; snowcover; snowpack; spatial extent; synthetic aperture radar; terrain mapping; wet snow; Atmosphere; Atmospheric modeling; Backscatter; Floods; Hydroelectric power generation; Meteorology; Radar measurements; Remote monitoring; Snow; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-6359-0
  • Type

    conf

  • DOI
    10.1109/IGARSS.2000.857335
  • Filename
    857335