DocumentCode
2249878
Title
Blind Determination of the Signal to Noise Ratio of Speech Signals Based on Estimation Combination of Multiple Features
Author
Ondusko, Russell ; Marbach, Matthew ; McClellan, Andrew ; Ramachandran, Ravi P. ; Head, Linda M. ; Huggins, Mark C. ; Smolenski, Brett Y
Author_Institution
Rowan Univ., Glassboro, NJ
fYear
2006
fDate
4-7 Dec. 2006
Firstpage
1895
Lastpage
1898
Abstract
A blind approach for estimating the signal to noise ratio (SNR) of a speech signal corrupted by additive noise is proposed. The method is based on a pattern recognition paradigm using various linear predictive based features, a vector quantizer classifier and estimation combination. Blind SNR estimation is very useful in speaker identification systems in which a confidence metric is determined along with the speaker identity. The confidence metric is partially based on the mismatch between the training and testing conditions of the speaker identification system and SNR estimation is very important in evaluating the degree of this mismatch. The aim is to correctly estimate SNR values from 0 to 30 dB, a range that is both practical and crucial for speaker identification systems. Additive white Gaussian noise and pink noise are investigated. The best feature for both white and pink noise is the vector of reflection coefficients which achieves an average SNR estimation error of 1.6 dB and 1.85 dB for white and pink noise respectively. Combining the estimates of 4 features lowers the error for white noise to 1.46 dB and for pink noise to 1.69 dB
Keywords
AWGN; blind source separation; error statistics; pattern recognition; speaker recognition; vector quantisation; additive white Gaussian noise; blind SNR estimation; linear predictive features; pattern recognition; pink noise; signal to noise ratio; speaker identification systems; speech signals; vector quantizer classifier; 1f noise; Acoustic reflection; Additive noise; Additive white noise; Estimation error; Pattern recognition; Signal to noise ratio; Speech enhancement; System testing; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2006. APCCAS 2006. IEEE Asia Pacific Conference on
Conference_Location
Singapore
Print_ISBN
1-4244-0387-1
Type
conf
DOI
10.1109/APCCAS.2006.342229
Filename
4145786
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