• DocumentCode
    2250551
  • Title

    Robotic workstation for AFM-based nanomanipulation inside an SEM

  • Author

    Mick, U. ; Weigel-Jech, M. ; Fatikow, S.

  • Author_Institution
    Div. Microrobotics & Control Eng. (AMiR), Univ. of Oldenburg & the Technol. Cluster Automated Nanohandling (TCANH), Oldenburg, Germany
  • fYear
    2010
  • fDate
    6-9 July 2010
  • Firstpage
    854
  • Lastpage
    859
  • Abstract
    Combining the SEM as a visual sensor with the force control of an AFM promises to provide a unique tool for automated robotic nanomanipulations. This article presents the development of a nanorobotic workstation that can use AFM capabilities for robotic nanomanipulations inside an SEM. The hardware architecture for the AFM setup inside the SEM is described in detail. The AFM capabilities are demonstrated by in-situ acquired AFM and SEM images of identical sample locations. Initial AFM-based manipulation experiments on manipulating a graphene sheet and on pushing nanosized polymer beads are presented. The integration of the system with haptic feedback for teleoperation and into a robotic automation and visual control framework is discussed.
  • Keywords
    atomic force microscopy; force control; micromanipulators; nanomechanics; AFM capabilities; AFM setup; AFM-based manipulation; AFM-based nanomanipulation; SEM images; automated robotic nanomanipulations; force control; graphene sheet; haptic feedback; hardware architecture; identical sample locations; in-situ acquired AFM; nanorobotic workstation; pushing nanosized polymer beads; robotic automation; teleoperation; visual control framework; visual sensor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Intelligent Mechatronics (AIM), 2010 IEEE/ASME International Conference on
  • Conference_Location
    Montreal, ON
  • Print_ISBN
    978-1-4244-8031-9
  • Type

    conf

  • DOI
    10.1109/AIM.2010.5695899
  • Filename
    5695899