DocumentCode
2251717
Title
Accuracy evaluation of point diffraction interferometer for EUVL mirror
Author
Otaki, K. ; Ota, K. ; Yamamoto, T. ; Fukuda, Y. ; Nishiyama, I. ; Okazaki, S.
Author_Institution
EUVL Lab., Assoc. of Super-Advanced Electron. Technol., Atsugi, Japan
fYear
2001
fDate
Oct. 31 2001-Nov. 2 2001
Firstpage
290
Lastpage
291
Abstract
The point diffraction interferometer (PDI) is expected to be a powerful measurement tool for EUVL projection optics. ASET have developed the PDI in corporation with Nikon. Half of transmitted wavefront generated by the pinhole is reflected by the test mirror and interfered with the other half. In PDI, the artificial reference is not used, then the very high accuracy measurement is enabled. Recently, the accuracy of PDI has been evaluated experimentally. Here, two types of accuracy are discussed. The term "repeatability" is the difference of two continuous measured data and the term "absolute accuracy" is the difference of measured figure from the real value.
Keywords
laser mirrors; light interferometers; optical projectors; ASET; EUVL mirror; absolute accuracy; extreme UV laser; point diffraction interferometer; projection optics; repeatability; test mirror; Area measurement; Atmosphere; Atmospheric measurements; Diffraction; Helium; Mirrors; Optical interferometry; Optical surface waves; Testing; Ultraviolet sources;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocesses and Nanotechnology Conference, 2001 International
Conference_Location
Shimane, Japan
Print_ISBN
4-89114-017-8
Type
conf
DOI
10.1109/IMNC.2001.984203
Filename
984203
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