DocumentCode
2253042
Title
High resolution spectral characterization of Betatron X-ray radiation
Author
Albert, Felicie ; Phuoc, Kim Ta ; Shah, Rahul ; Fitour, Romuald ; Burgy, Frederic ; Tafzi, Amar ; Douillet, Denis ; Lefrou, Thierry ; Rousse, Antoine
Author_Institution
LOA-ENSTA-Ecole Polytech., CNRS, Palaiseau
fYear
2008
fDate
4-9 May 2008
Firstpage
1
Lastpage
2
Abstract
We present the first detailed spectral measurement of 1-3 keV Betatron X-ray radiation with two high resolution crystal spectrometers. Electron trajectories in the laser produced plasma can be determined with this measurement.
Keywords
plasma X-ray sources; plasma diagnostics; plasma light propagation; Betatron X-ray radiation; crystal spectrometers; electron trajectories; electron volt energy 1 keV to 3 keV; hard X-ray source; high resolution spectral characterization; laser produced plasma; laser-plasma interaction; Chemical lasers; Electrons; Plasma measurements; Plasma properties; Plasma sources; Plasma x-ray sources; Spectroscopy; X-ray diffraction; X-ray imaging; X-ray lasers;
fLanguage
English
Publisher
iet
Conference_Titel
Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
Conference_Location
San Jose, CA
Print_ISBN
978-1-55752-859-9
Type
conf
Filename
4572170
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