DocumentCode
2258283
Title
Power gating design for standard-cell-like structured ASICs
Author
Chen, Sin-Yu ; Lin, Rung-Bin ; Tung, Hui-Hsiang ; Lin, Kuen-Wey
Author_Institution
Comput. Sci. & Eng. Line, Yuan Ze Univ., Chungli, Taiwan
fYear
2010
fDate
8-12 March 2010
Firstpage
514
Lastpage
519
Abstract
Structured ASIC has been introduced to bridge the power, performance, area and design cost gaps between ASIC and FPGA. As technology scales, leakage power consumption becomes a serious problem. Among the leakage power reduction techniques, power gating is commonly used to disconnect idle logic blocks from power network to curtail sub-threshold leakage. In this paper, we apply power gating to structured ASICs for leakage power reduction. We present a power-gated via-configurable logic block (PGVCLB) and a power gated design flow mostly using existing standard cell design tools. We can configure PGVCLBs in a design to implement fine-grained power gating, coarse-grained/cluster-based power gating or even distributed sleep transistor network (DSTN). With fine-grained power gating, we can achieve 52% leakage reduction on average with only 8% area and 17% delay overheads when compared to the data obtained using a non-power-gated library.
Keywords
application specific integrated circuits; field programmable gate arrays; logic design; FPGA; application specific integrated circuits; coarse-grained/cluster-based power gating; distributed sleep transistor network; fine-grained power gating; idle logic blocks; leakage power consumption; leakage power reduction techniques; power gating design; power network; power-gated via-configurable logic block; standard cell design tools; standard-cell-like structured ASIC; sub-threshold leakage; Application specific integrated circuits; Costs; Delay; Field programmable gate arrays; Libraries; Logic arrays; Logic design; Power engineering and energy; Sleep; Voltage; low power; power-gating; structured ASIC; via-configurable;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location
Dresden
ISSN
1530-1591
Print_ISBN
978-1-4244-7054-9
Type
conf
DOI
10.1109/DATE.2010.5457152
Filename
5457152
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