Statistical study of nano-scale VLSI interconnect crosstalk and its induced power estimation

Crosstalk due to the capacitive and inductive coupling has adverse effect on the circuit performance. In this paper crosstalk voltage and its induced power are studied for a stochastic environment bus with specific physical structure. Input switching pattern, driver, and load are swept in wide range for VLSI application to study crosstalk variation. Crosstalk and power is extracted to drive mean and standard deviation for implemented structures. The crosstalk mean and its induced power get lower with increasing of the load and driver resistance. This phenomenon is proportional to shrinking the technology.