Error analysis of quartz crystal resonator applications

Author

Lucklum, Ralf ; Behling, C. ; Hauptmann, P. ; Cernosek, R.W. ; Martin, S.J.

Author_Institution

Otto-von-Guerike-Univ., Magdeburg, Germany

Volume

2

fYear

1997

fDate

16-19 Jun 1997

Firstpage

1347

Abstract

Quartz crystal resonators in chemical sensing applications are usually configured as the frequency determining element of an electrical oscillator. By contrast, the shear modulus determination of a polymer coating needs a complete impedance analysis. The first part of this contribution reports the error made if common approximations are used to relate the frequency shift to the sorbed mass. In the second part we discuss different error sources in the procedure to determine shear parameters

Keywords

acoustic impedance; chemical sensors; error analysis; polymer films; shear modulus; surface acoustic wave resonators; surface acoustic wave sensors; SiO₂; acoustic wave devices; chemical sensing application; electrical oscillator; error analysis; error sources; frequency determining element; frequency shift; impedance analysis; polymer coating; quartz crystal resonator applications; shear modulus; shear parameters; sorbed mass; Acoustic sensors; Acoustic waves; Chemical sensors; Coatings; Crystalline materials; Elasticity; Error analysis; Frequency; Surface impedance; Viscosity;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid State Sensors and Actuators, 1997. TRANSDUCERS '97 Chicago., 1997 International Conference on

Conference_Location

Chicago, IL

Print_ISBN

0-7803-3829-4

Type

conf

DOI

10.1109/SENSOR.1997.635486

Filename

635486