• DocumentCode
    2259169
  • Title

    The novel SCR-based ESD protection device with high holding voltage

  • Author

    Won, Jong-Il ; Shin, Samuell ; Ha, Ka-San ; Kwon, Jong-Ki ; Koo, Yong-Seo

  • Author_Institution
    Dept. of Electron. Eng., SeoKyeong Univ., Seoul, South Korea
  • fYear
    2009
  • fDate
    24-27 May 2009
  • Firstpage
    1779
  • Lastpage
    1782
  • Abstract
    This paper introduces a novel silicon controlled rectifier (SCR)-based device for ESD power clamp and I/O clamp. The device obtained the high holding voltage and low triggering voltage by adding a p-drift junction and n-well in the cathode region. These characteristics enable latch-up immune normal operation as well as superior full chip ESD protection. The proposed device is designed by compatible 0.35 um BCD (bipolar-CMOS-DMOS) technology. We investigated electrical characteristic by measurement and TCAD simulation. In the measurement result, the proposed device has triggering voltage of 12.8 V and holding voltage of 10 V. The proposed device has high holding voltage as well as high robustness and second breakdown current. (It2=67.4mA/um).
  • Keywords
    CMOS integrated circuits; electrostatic discharge; rectifying circuits; ESD power clamp; I/O clamp; SCR-based ESD protection; bipolar-CMOS-DMOS; cathode region; high holding voltage; p-drift junction; silicon controlled rectifier-based device; size 0.35 mum; voltage 10 V; voltage 12.8 V; Breakdown voltage; Cathodes; Clamps; Electric variables; Electric variables measurement; Electrostatic discharge; Low voltage; Protection; Semiconductor device measurement; Thyristors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-3827-3
  • Electronic_ISBN
    978-1-4244-3828-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.2009.5118121
  • Filename
    5118121