DocumentCode
2259370
Title
Concurrently testable FPGA design for molecular QCA using conservative reversible logic gate
Author
Thapliyal, Himanshu ; Ranganathan, Nagarajan
Author_Institution
Dept. of Comput. Sci. & Eng., Univ. of South Florida, Tampa, FL, USA
fYear
2009
fDate
24-27 May 2009
Firstpage
1815
Lastpage
1818
Abstract
Reversible logic is attracting the researchers attention for fault susceptible nanotechnologies including molecular QCA. In this paper, we propose concurrently testable FPGA design for molecular QCA using conservative reversible Fredkin gate. Fredkin gate is conservative reversible in nature, in which there would be an equal number of 1s in the outputs as there would be on the inputs, in addition to one-to-one mapping. Fault patterns in Fredkin gate are analyzed using HDLQ tool due to a single missing/additional cell defect in molecular QCA. Exhaustive simulation shows that if there is a fault in molecular QCA implementation of Fredkin gate, there is a parity mismatch between the inputs and the outputs; otherwise the inputs parity is same as outputs parity. Thus, any permanent and transient fault in molecular QCA that results in parity mismatch can be concurrently detected. The logic block and the routing fabric (both are programmable) are the two key components of an FPGA. Thus, we have shown the Fredkin gate based concurrently testable designs of the configurable logic block (CLB) and the routing switch of a molecular QCA-based FPGA. Analysis of power dissipation in the proposed FPGA is also shown.
Keywords
cellular automata; circuit testing; fault diagnosis; field programmable gate arrays; logic design; logic gates; molecular electronics; nanotechnology; quantum dots; Quantum dot cellular automata; cell defect; configurable logic block; conservative reversible Fredkin logic gate; fault susceptible nanotechnologies; molecular QCA; power dissipation; routing switch; testable FPGA design; transient fault; Fabrics; Fault detection; Field programmable gate arrays; Logic design; Logic gates; Logic testing; Pattern analysis; Quantum cellular automata; Routing; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on
Conference_Location
Taipei
Print_ISBN
978-1-4244-3827-3
Electronic_ISBN
978-1-4244-3828-0
Type
conf
DOI
10.1109/ISCAS.2009.5118130
Filename
5118130
Link To Document