• DocumentCode
    2259370
  • Title

    Concurrently testable FPGA design for molecular QCA using conservative reversible logic gate

  • Author

    Thapliyal, Himanshu ; Ranganathan, Nagarajan

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Univ. of South Florida, Tampa, FL, USA
  • fYear
    2009
  • fDate
    24-27 May 2009
  • Firstpage
    1815
  • Lastpage
    1818
  • Abstract
    Reversible logic is attracting the researchers attention for fault susceptible nanotechnologies including molecular QCA. In this paper, we propose concurrently testable FPGA design for molecular QCA using conservative reversible Fredkin gate. Fredkin gate is conservative reversible in nature, in which there would be an equal number of 1s in the outputs as there would be on the inputs, in addition to one-to-one mapping. Fault patterns in Fredkin gate are analyzed using HDLQ tool due to a single missing/additional cell defect in molecular QCA. Exhaustive simulation shows that if there is a fault in molecular QCA implementation of Fredkin gate, there is a parity mismatch between the inputs and the outputs; otherwise the inputs parity is same as outputs parity. Thus, any permanent and transient fault in molecular QCA that results in parity mismatch can be concurrently detected. The logic block and the routing fabric (both are programmable) are the two key components of an FPGA. Thus, we have shown the Fredkin gate based concurrently testable designs of the configurable logic block (CLB) and the routing switch of a molecular QCA-based FPGA. Analysis of power dissipation in the proposed FPGA is also shown.
  • Keywords
    cellular automata; circuit testing; fault diagnosis; field programmable gate arrays; logic design; logic gates; molecular electronics; nanotechnology; quantum dots; Quantum dot cellular automata; cell defect; configurable logic block; conservative reversible Fredkin logic gate; fault susceptible nanotechnologies; molecular QCA; power dissipation; routing switch; testable FPGA design; transient fault; Fabrics; Fault detection; Field programmable gate arrays; Logic design; Logic gates; Logic testing; Pattern analysis; Quantum cellular automata; Routing; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-3827-3
  • Electronic_ISBN
    978-1-4244-3828-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.2009.5118130
  • Filename
    5118130