Statistical SRAM analysis for yield enhancement

This paper presents an automated technique to perform SRAM wide statistical analysis in presence of process variability. The technique is implemented in a prototype tool and is demonstrated on several 45 and 32nm industry-grade SRAM vehicles. Selected case studies show how this approach successfully captures non-trivial statistical interactions between the cells and the periphery, which remain uncovered when only using statistical electrical simulations of the critical path or applying a digital corner approach. The presented tool provides the designer with valuable information on what performance metrics to expect, if manufactured. Since this feedback takes place in the design phase, a significant reduction in development time and cost can be achieved.