• DocumentCode
    2260354
  • Title

    Multicore soft error rate stabilization using adaptive dual modular redundancy

  • Author

    Vadlamani, Ramakrishna ; Zhao, Jia ; Burleson, Wayne ; Tessier, Russell

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Massachusetts, Amherst, MA, USA
  • fYear
    2010
  • fDate
    8-12 March 2010
  • Firstpage
    27
  • Lastpage
    32
  • Abstract
    The use of dynamic voltage and frequency scaling (DVFS) in contemporary multicores provides significant protection from unpredictable thermal events. A side effect of DVFS can be an increased processor exposure to soft errors. To address this issue, a flexible fault prevention mechanism has been developed to selectively enable a small amount of per-core dual modular redundancy (DMR) in response to increased vulnerability, as measured by the processor architectural vulnerability factor (AVF). Our new algorithm for DMR deployment aims to provide a stable effective soft error rate (SER) by using DMR in response to DVFS caused by thermal events. The algorithm is implemented in real-time on the multicore using a dedicated monitor network-on-chip and controller which evaluates thermal information and multicore performance statistics. Experiments with a multicore simulator using standard benchmarks show an average 6% improvement in overall power consumption and a stable SER by using selective DMR versus continuous DMR deployment.
  • Keywords
    error detection; fault tolerant computing; multiprocessing systems; network-on-chip; redundancy; stability; DVFS; adaptive dual modular redundancy; dynamic voltage and frequency scaling; flexible fault prevention mechanism; monitor network-on-chip; multicore performance statistics; multicore soft error rate stabilization; per-core DMR; per-core dual modular redundancy; power consumption; processor AVF; processor architectural vulnerability factor; stable SER; thermal information; Dynamic voltage scaling; Energy consumption; Error analysis; Frequency; Monitoring; Multicore processing; Network-on-a-chip; Protection; Redundancy; Statistics; DVFS; architectural vulnerability; monitor network;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4244-7054-9
  • Type

    conf

  • DOI
    10.1109/DATE.2010.5457242
  • Filename
    5457242