Measuring and comparing humidity acceleration factors of compound semiconductors

Purpose: Product reliability investigations typically include accelerated humidity testing. Originally, the ldquostandardrdquo test was a biased 85degC/85% Relative Humidity lifetest for 1000 hours. Since the 85/85 test, reliability scientists have searched for an alternate accelerated test. This study is intended to investigate the thermal and moisture acceleration for ldquostandardrdquo tests on Compound Semiconductors with a specific goal of estimating reliability of all failure mechanisms anticipated in Power Amplifier Modules operating in humid conditions.