DocumentCode
2261902
Title
Machine model ESD tester for enhanced capacitor reliability
Author
Marchut, L. ; Antonell, M. ; Fresina, M. ; Novak, C. ; Meeder, M. ; Darche, T. ; Chamberlain, S. ; Antonell, J.
Author_Institution
RFMD, Inc., Greensboro, NC, USA
fYear
2009
fDate
11-11 Oct. 2009
Firstpage
85
Lastpage
95
Abstract
Electro-static discharge (ESD) is a common failure mode during field service and customer assembly. To develop and verify capacitor designs that are rugged during customer assembly and field service, sufficient quantities of devices need to be tested to determine larger failure voltage distributions than the minimal three required for product qualification. Using ESD voltage breakdown testing can more precisely simulate actual field failures when compared to using on-wafer DC ramp-to-failure voltage testing.
Keywords
capacitors; electrostatic discharge; reliability; testing; ESD tester; electro-static discharge; enhanced capacitor; machine model; product qualification; reliability; Assembly; Breakdown voltage; Cathode ray tubes; Dielectrics; Electrostatic discharge; Insertion loss; MIM capacitors; Radio frequency; Switches; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability of Compound Semiconductors Digest (ROCS), 2009
Conference_Location
Greensboro, NC
Print_ISBN
978-0-7908-0124-7
Type
conf
Filename
5313984
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