• DocumentCode
    2261902
  • Title

    Machine model ESD tester for enhanced capacitor reliability

  • Author

    Marchut, L. ; Antonell, M. ; Fresina, M. ; Novak, C. ; Meeder, M. ; Darche, T. ; Chamberlain, S. ; Antonell, J.

  • Author_Institution
    RFMD, Inc., Greensboro, NC, USA
  • fYear
    2009
  • fDate
    11-11 Oct. 2009
  • Firstpage
    85
  • Lastpage
    95
  • Abstract
    Electro-static discharge (ESD) is a common failure mode during field service and customer assembly. To develop and verify capacitor designs that are rugged during customer assembly and field service, sufficient quantities of devices need to be tested to determine larger failure voltage distributions than the minimal three required for product qualification. Using ESD voltage breakdown testing can more precisely simulate actual field failures when compared to using on-wafer DC ramp-to-failure voltage testing.
  • Keywords
    capacitors; electrostatic discharge; reliability; testing; ESD tester; electro-static discharge; enhanced capacitor; machine model; product qualification; reliability; Assembly; Breakdown voltage; Cathode ray tubes; Dielectrics; Electrostatic discharge; Insertion loss; MIM capacitors; Radio frequency; Switches; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability of Compound Semiconductors Digest (ROCS), 2009
  • Conference_Location
    Greensboro, NC
  • Print_ISBN
    978-0-7908-0124-7
  • Type

    conf

  • Filename
    5313984